Principles of Analytical Electron Microscopy

Principles of Analytical Electron Microscopy

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Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the qphysics of the processesq and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.(d) 100 200 300 eV 100 ENERGY LOSS 2OO 300 eV Figure 10 Appearance of Si L; edge in (a) Si and (b) SiO- sample of ... Figure 1 1 Schematic illustration of the form of the low loss spectrum (a, c, e) and an inner-shell edge (b. d. 0 at threeanbsp;...


Title:Principles of Analytical Electron Microscopy
Author: David C. Joy, Alton D. Romig Jr.
Publisher:Springer Science & Business Media - 1986-07-31
ISBN-13:

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